Title :
Hybrid substrate testing
Author :
Crowley, Daniel F.
Author_Institution :
Teledyne TAC, Woburn, MA, USA
Abstract :
The use of a programmable capacitance tester to automate substrate testing is explained. Open and short circuits can readily be identified utilizing a single-point capacitance tester. A circuit trace within a substrate exhibits a finite capacitance with respect to an external ground plane. Open and short circuits cause a variation in this capacitance leading to the detection of faults. The single-point probe system offers fast programming and run times.<>
Keywords :
automatic test equipment; capacitance measurement; fault location; hybrid integrated circuits; integrated circuit testing; bare hybrid IC testing; circuit trace; closed circuits detection; detection of faults; fast programming; fast run times; hybrid IC; open circuits detection; programmable capacitance tester; single-point capacitance tester; single-point probe system; substrate testing; Automatic testing; Capacitance; Circuit faults; Circuit testing; Costs; Fabrication; Fixtures; Materials testing; Performance evaluation; Probes;
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1988, Design-to-Manufacturing Transfer Cycle. Fifth IEEE/CHMT International
Conference_Location :
Lake Buena Vista, FL, USA
DOI :
10.1109/EMTS.1988.16182
