• DocumentCode
    1646842
  • Title

    Functional and scan tests: The effectiveness of I/sub DDQ/ how many fault coverages do we need?

  • Author

    Maxwell, P.C. ; Inshen Chiang

  • fYear
    1995
  • Firstpage
    168
  • Keywords
    Circuit faults; Circuit testing; Condition monitoring; Delay; Extrapolation; Fault detection; Integrated circuit testing; Power supplies; Production; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527817
  • Filename
    527817
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1646842