• DocumentCode
    1647128
  • Title

    Diagnostic Fault Simulation of Sequential Circuits

  • Author

    Rudnick, Elizabeth M. ; Fuchs, W. Kent ; Patel, Janak H.

  • fYear
    1992
  • Firstpage
    178
  • Keywords
    Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Fault diagnosis; Power measurement; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527818
  • Filename
    527818
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1647128