DocumentCode
1647259
Title
High-Q 3D embedded inductors using TSV for RF MEMS tunable bandpass filters (4.65–6.8 GHz)
Author
Vitale, W.A. ; Fernandez-Bolanos, M. ; Ionescu, A.M.
Author_Institution
Nanoelectronic Device Lab. (NanoLab), Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
fYear
2012
Firstpage
822
Lastpage
825
Abstract
This paper presents the optimization design of 3D integrated inductors exploiting through silicon vias (TSV) technology to improve the quality (Q) factor in the 2-20 GHz range. The embedded inductor allows the heterogeneous integration with CMOS and MEMS components in a size-compact and low-cost manufacturing process. Results limited to our manufacturing possibilities (5.5×15 μ m-area tungsten TSVs, high resistivity (HR) silicon substrate) show Q-factor values as high as 35 at 8 GHz for 4.8 nH inductance, and design methods to improve them. These inductors are attractive to be used with MEMS capacitors for reconfigurable RFICs, as proposed for a tunable passband filter in the range 4.65 - 6.8 GHz. The filter shows 15% continuous linear center frequency tuning and over 45% in a digital fashion. The filter is also continuously tunable in bandwidth (up to 40%) while keeping constant the center frequency.
Keywords
Q-factor; band-pass filters; capacitors; circuit tuning; field effect MMIC; inductors; micromechanical devices; microwave filters; three-dimensional integrated circuits; 3D integrated inductors; CMOS components; MEMS capacitors; Q factor improvement; RF MEMS tunable bandpass filters; TSV technology; continuous linear center frequency tuning; design optimisation; frequency 4.65 GHz to 6.8 GHz; frequency 8 GHz; high-Q 3D embedded inductors; low-cost manufacturing process; quality factor improvement; reconfigurable RFIC; size-compact manufacturing process; through silicon vias technology; tunable passband filter; Coils; Inductance; Inductors; Micromechanical devices; Q-factor; Through-silicon vias; Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
Conference_Location
Amsterdam
Print_ISBN
978-1-4673-2302-4
Electronic_ISBN
978-2-87487-026-2
Type
conf
Filename
6483927
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