• DocumentCode
    1647409
  • Title

    Miniaturized synthetic rectangular waveguide

  • Author

    Hsien-Shun Wu ; Tzuang, C.-K.C.

  • Author_Institution
    Inst. of Electr. Commun. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1099
  • Abstract
    An artificially engineered, dielectric-filled rectangular waveguide is presented. Such a synthetic waveguide, made by a conventional printed-circuit board (PCB) process, consists of two-dimensional periodical arrays at the top and bottom surfaces and two metallic sidewalls. A synthetic waveguide of cross-section 8.0 mm by 0.609 mm, relative permittivity (/spl epsiv//sub r/) 3.38, shows a cutoff frequency at 4 GHz with normalized propagation constant asymptotically approaching 4.5 at frequencies much greater than the cutoff frequency. Rigorous measurements show that the extracted dispersion curves agree well with theoretical data, demonstrating the feasibility of size reduction of the synthetic rectangular waveguide, breaking the well-known limit of 1//spl radic/(/spl epsiv//sub r/) imposed on conventional rectangular waveguides. Measured data show that the slow-wave factor is 185% higher and cutoff frequency 61.9% lower when comparing the synthetic waveguide with a conventional waveguide of identical dimensions and material constant.
  • Keywords
    dielectric-loaded waveguides; dispersion (wave); periodic structures; printed circuit design; rectangular waveguides; slow wave structures; 0.609 mm; 4 GHz; 8.0 mm; artificially engineered dielectric-filled rectangular waveguide; cutoff frequency; dispersion curves; metallic sidewalls; miniaturized synthetic rectangular waveguide; normalized propagation constant; printed-circuit board process; relative permittivity; scattering parameters; size reduction; slow-wave factor; synthetic waveguide cross-section; two-dimensional periodical arrays; Cutoff frequency; Data mining; Dielectrics; Dispersion; Permittivity measurement; Propagation constant; Rectangular waveguides; Size measurement; Surface waves; Waveguide theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1212560
  • Filename
    1212560