DocumentCode
1647547
Title
New dielectric-covered waveguide-to-microstrip transitions for Ka-band transceivers
Author
Kang Wook Kim ; Chae-Ho Na ; Dong-Sik Woo
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu, South Korea
Volume
2
fYear
2003
Firstpage
1115
Abstract
New dielectric-covered waveguide-to-microstrip transitions at Ka-band have been developed. These transitions are probe-type, but the dielectric material completely covers the waveguide opening in order to provide a moisture barrier and robustness. These transitions are also designed to be less sensitive to fabrication tolerances. The transition structures have been comprehensively analyzed using a 3-D EM software. The resonance phenomena caused by the waveguide-wall discontinuity have been removed by placing vias around the waveguide aperture. These transitions have also been fabricated and measured. The measured insertion loss of the transition is less than 0.4 dB and the return loss is about 15 dB over the entire Ka-band.
Keywords
computational electromagnetics; dielectric materials; microstrip transitions; transceivers; waveguide discontinuities; waveguide transitions; 0.4 dB; 15 dB; 3-D EM software; Ka-band transceivers; dielectric material; dielectric-covered waveguide-to-microstrip transitions; fabrication tolerance sensitivity; insertion loss; moisture barrier; probe-type transitions; resonance phenomena; return loss; robustness; transition structures; vias; waveguide-wall discontinuity; Apertures; Dielectric materials; Fabrication; Loss measurement; Moisture; Resonance; Robustness; Transceivers; Waveguide discontinuities; Waveguide transitions;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location
Philadelphia, PA, USA
ISSN
0149-645X
Print_ISBN
0-7803-7695-1
Type
conf
DOI
10.1109/MWSYM.2003.1212564
Filename
1212564
Link To Document