Title :
A 77-GHz down-conversion mixer architecture with built-in test capability in SiGe technology
Author :
Kissinger, Dietmar ; Knapp, Herbert ; Maurer, Linus ; Weigel, Robert
Author_Institution :
Inst. for Electron. Eng., Univ. of Erlangen-Nuremberg, Erlangen, Germany
Abstract :
A 77-GHz double-balanced mixer in a 200 GHz ft silicon-germanium technology is presented. The proposed mixer architecture is capable of simultaneous direct up- and down-conversion of two separate input signals without additional power consumption. An up-converted low-frequency test signal is coupled back into the receiver RF input path to enable a built-in functionality test of the down-conversion path of the mixer. The circuit exhibits a conversion gain of 20 dB and draws 22mA from a 3.3V supply. The fabricated chip occupies an area of 1028 × 1128μm2.
Keywords :
Ge-Si alloys; built-in self test; millimetre wave mixers; radio receivers; RF receiver; SiGe; built-in test capability; current 22 mA; double-balanced mixer; down-conversion mixer architecture; frequency 200 GHz; frequency 77 GHz; gain 20 dB; power consumption; silicon-germanium technology; voltage 3.3 V; Frequency measurement; Impedance matching; Mixers; Power generation; Radio frequency; Receivers; Silicon germanium; 77 GHz; SiGe; automotive radar; built-in testing; down-conversion; millimeter wave; mixer;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-8578-9
DOI :
10.1109/BIPOL.2010.5668040
