Title :
A wide supply voltage and low-Rx noise Envelope tracking supply modulator IC for LTE handset power amplifiers
Author :
Honda, Yuma ; Yokota, Yuji ; Goto, Nasato ; Matsuno, Noriaki ; Saito, Yuya
Author_Institution :
Compound Semicond. Devices Div., Renesas Electron. Corp., Kawasaki, Japan
Abstract :
A high efficiency envelope tracking supply modulator IC for LTE handset use is presented. It is fabricated using 0.35 um CMOS with optional 6-V-MOSFETs, and operates at a wide supply voltage range from 2.9 to 6.0 V. This enables the supply modulator to be directly connected to a lithium-ion battery. The switching noise of the supply modulator is carefully designed to meet the received band (Rx) noise requirement. An envelope tracking power amplifier (ET-PA) consisting of the modulator IC and an InGaP/GaAs-heterojunction-bipolar-transistor (HBT) PA-IC is examined with 1.95-GHz-band, 10-MHz bandwidth long-term-evolution (LTE) up-link signal. Despite a use of high-breakdown-voltage CMOS process for the modulator, the ET-PA achieves a power-added efficiency (PAE) of 33.4% at an output power of 26 dBm with an adjustment channel leakage power ratio (ACLR) of -35 dBc. In comparison with a conventional PA, the PAE has improved 3.0 and 7.3% at an output power of 26 and 20 dBm, respectively. The Rx noise is -134 dBm/Hz.
Keywords :
Long Term Evolution; heterojunction bipolar transistors; power amplifiers; CMOS process; LTE handset power amplifiers; LTE handset use; adjustment channel leakage power ratio; envelope tracking power amplifier; envelope tracking supply modulator IC; heterojunction bipolar transistor; lithium ion battery; long term evolution; power added efficiency; supply voltage; switching noise; uplink signal; Frequency modulation; Integrated circuits; Noise; Power amplifiers; Radio frequency; Switches; Efficiency; Rx noise; envelope tracking; long term evolution (LTE); wide supply voltage range;
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2302-4
Electronic_ISBN :
978-2-87487-026-2