• DocumentCode
    1647687
  • Title

    Efficient computation of thin-layer structures with the unconditionally stable ADI-FDTD method

  • Author

    Chenghao Yuan ; Zhizhang Chen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Dalhousie Univ., Halifax, NS, Canada
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1133
  • Abstract
    Efficient computation is a key consideration in computational electromagnetics, especially for complex VLSI structures that contain thin dielectric layers or electrically small objects. Due to the CFL stability condition, it is very inefficient to apply the conventional FDTD method to thin-layer structures because fine mesh (and therefore small time step) is required. In this paper, the unconditionally stable ADI-FDTD method is employed to circumvent the difficulty. With applications in computing effective dielectric constant (/spl epsiv//sub eff/) and characteristic impedance (Z/sub 0/) of cylindrical microstrip lines, it is shown that the computation time with the ADI-FDTD method is much shorter than that of the conventional FDTD method without sacrificing modeling accuracy.
  • Keywords
    computational electromagnetics; electric impedance; finite difference time-domain analysis; microstrip lines; permittivity; waveguide theory; CFL stability condition; absorbing boundary condition; characteristic impedance; complex VLSI structures; computation time; computational electromagnetics; cylindrical microstrip tines; effective dielectric constant; electrically small objects; fine mesh; modeling accuracy; thin dielectric layers; thin-layer structures; unconditionally stable ADI-FDTD method; Boundary conditions; Computational electromagnetics; Computational modeling; Conductivity; Equations; Finite difference methods; Frequency; Microwave theory and techniques; Time domain analysis; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1212568
  • Filename
    1212568