DocumentCode :
164792
Title :
A flexibly fault-tolerant FU array processor and its self-tuning scheme to locate permanently defective unit
Author :
Yao, JingTao ; Nakashima, Yuta ; Saito, Masato ; Hazama, Yohei ; Yamanaka, Ryosuke
Author_Institution :
Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Ikoma, Japan
fYear :
2014
fDate :
14-16 April 2014
Firstpage :
1
Lastpage :
3
Abstract :
In this work, we propose the Explicit Redundancy Linear Array (EReLA) architecture to provide a highly flexible fault-toleration, which effectively utilizes its rich resources in a functional unit (FU) array for both the error detection and the fail-safe hot-swap after taking a permanent fault. For the preparation of the hot-swap, a self-tuning scheme is proposed specifically to fast locate the precise position of the permanently defective units, which can be either the computational, LD/ST FUs, or the connecting network as well. EReLA can thereby isolates the permanently defective unit at the smallest granularity, which allows more hot-swaps and extends accordingly the lifespan of the whole processor. Given these schemes, EReLA is functionally same to a traditional TMR processor in terms of fault toleration, while the power data of a 180nm prototype EReLA chip has indicated that it incurs far less power consumption than the TMR implementation.
Keywords :
error detection; fault tolerant computing; microprocessor chips; parallel processing; redundancy; EReLA architecture; error detection; explicit redundancy linear array architecture; fail-safe hot-swap; fault toleration; functional unit array; highly flexible fault-toleration; permanent fault; permanently defective unit; self-tuning scheme; size 180 nm; traditional TMR processor; Arrays; Circuit faults; Hardware; Radiation detectors; Redundancy; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
COOL Chips XVII, 2014 IEEE
Conference_Location :
Yokohama
Type :
conf
DOI :
10.1109/CoolChips.2014.6842951
Filename :
6842951
Link To Document :
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