• DocumentCode
    1647989
  • Title

    MMV: Metamodeling Based Microprocessor Valiation Environment

  • Author

    Dingankar, Ajit ; Mathaikutty, Deepak A. ; Kodakara, Sreekumar V. ; Shukla, Satyavati ; Lilja, David

  • Author_Institution
    Validation Technol., Intel Corp., Folsom, CA
  • fYear
    2006
  • Firstpage
    143
  • Lastpage
    148
  • Abstract
    With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validation challenges. The systematic validation approach starts with defining the correct behaviors of the hardware and software components and their interactions. This requires a new modeling paradigm that supports multiple levels of abstraction. Mutual consistency of models at adjacent levels is crucial for manual refinement of models from the full chip level to production RTL, which is likely to remain the dominant design methodology of complex microprocessors in the near future. In this work, we present MMV, a validation environment based on metamodeling, that can be used to create models at various, abstraction levels and to generate most of the important validation collaterals, viz., simulators, checkers, coverage and test generation tools. We illustrate the functionalities in MMV by modeling a 32 bit RISC processor at the system, instruction set architecture and microarchitecture levels. We show by examples how consistency across levels is enforced during modeling and also how to generate constraints for automatic test generation
  • Keywords
    automatic test pattern generation; microprocessor chips; reduced instruction set computing; 32 bit RISC processor modeling; automatic test generation; constraint generation; instruction set architecture; metamodeling based microprocessor validation environment; microarchitecture level; multiple processing core; reduced instruction set computing; systematic validation; validation collateral; Design methodology; Face; Hardware; Metamodeling; Microarchitecture; Microprocessors; Production; Reduced instruction set computing; Refining; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Level Design Validation and Test Workshop, 2006. Eleventh Annual IEEE International
  • Conference_Location
    Monterey, CA
  • ISSN
    1552-6674
  • Print_ISBN
    1-4244-0679-X
  • Electronic_ISBN
    1552-6674
  • Type

    conf

  • DOI
    10.1109/HLDVT.2006.319978
  • Filename
    4110077