DocumentCode
1648062
Title
A boundary scan test controller for hierarchical BIST
Author
Matos, José S. ; Pinto, Filipe S. ; Ferreira, José M M
fYear
1995
Firstpage
217
Keywords
Application specific integrated circuits; Automatic control; Automatic test pattern generation; Automatic testing; Binary search trees; Built-in self-test; Circuit testing; Logic testing; Standards development; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527822
Filename
527822
Link To Document