1648062

A boundary scan test controller for hierarchical BIST

Matos, José S. ; Pinto, Filipe S. ; Ferreira, José M M

1995

217

Application specific integrated circuits; Automatic control; Automatic test pattern generation; Automatic testing; Binary search trees; Built-in self-test; Circuit testing; Logic testing; Standards development; System testing;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527822

527822