DocumentCode :
1648337
Title :
Boundary scan testing for multichip modules
Author :
Hilla, Stephen C.
fYear :
1995
Firstpage :
224
Keywords :
Application software; Assembly; Circuit testing; Image processing; Integrated circuit interconnections; Multichip modules; Probes; Silicon; System testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1992. Proceedings., International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-0760-7
Type :
conf
DOI :
10.1109/TEST.1992.527823
Filename :
527823
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1648337
