• DocumentCode
    1648337
  • Title

    Boundary scan testing for multichip modules

  • Author

    Hilla, Stephen C.

  • fYear
    1995
  • Firstpage
    224
  • Keywords
    Application software; Assembly; Circuit testing; Image processing; Integrated circuit interconnections; Multichip modules; Probes; Silicon; System testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527823
  • Filename
    527823
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1648337