Title :
Extracting a simplified view of design functionality via vector simulation
Author :
Guzey, Onur ; Wen, Charles ; Wang, Li.-C. ; Feng, Tao ; Abadir, Magdy S.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA
Abstract :
This paper presents a simulation-based methodology for extracting a simplified view of a design´s input-output behavior. Such a simplified design view can be used to facilitate test pattern justification from the outputs of the module to the inputs of the module. In this paper, extraction of a design simplification view is formulated as a learning problem. With a learning scheme for learning word-level functions, the core of the problem becomes developing an efficient Boolean learner. We discuss the implementation of such a Boolean learner and compare its performance with the one of best-known Boolean learning algorithms, the Fourier analysis based method. Experimental results are presented to illustrate the implementation of the simulation-based methodology and its usage for extracting a simplified functionality view from Open RISC 1200 datapath
Keywords :
Boolean functions; automatic test pattern generation; learning (artificial intelligence); logic design; Boolean learning; automatic test pattern generator; input-output behavior; simplified design functionality view extraction; vector simulation; word-level function learning; Algorithm design and analysis; Automatic test pattern generation; Conferences; Data mining; Performance analysis; Reduced instruction set computing; Semiconductor device testing; Sequential analysis; System testing; Test pattern generators;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2006. Eleventh Annual IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0680-3
Electronic_ISBN :
1552-6674
DOI :
10.1109/HLDVT.2006.319991