Title :
Proceedings of the 2006 International Conference on Computer-Aided Design
Abstract :
The following topics are dealt with: parasitic simulation; parasitic modeling; post-placement optimization; variation modeling; multicore systems; embedded systems; UML; systemC; industrial ESL design; delay test generation; power grid analysis and design; floorplanning; digital testing; RF testing; reliability; statistical timing analysis; system level design; analog simulation; analog verification; high level synthesis; CAD; analog design automation; system level interconnection; placement optimization; power analysis; mixed signal design; global routing; signal integrity; fault tolerant energy minimization; real-time systems; clock synthesis; buffer synthesis; thermal analysis; nanoelectronics; technology driven layout; nanoscale architecture; dynamic power management; model checking; biotechnology; MEMS; NEMS; accelerating verification; model order reduction; parametric analysis; and molecular scale systems
Keywords :
analogue circuits; circuit layout CAD; circuit testing; embedded systems; integrated circuits; micromechanical devices; nanoelectronics; power grids; thermal analysis; CAD; MEMS; NEMS; RF testing; UML; accelerating verification; analog design automation; analog simulation; analog verification; biotechnology; buffer synthesis; clock synthesis; delay test generation; digital testing; dynamic power management; embedded systems; fault tolerant energy minimization; floorplanning; global routing; high level synthesis; industrial ESL design; mixed signal design; model checking; model order reduction; molecular scale systems; multicore systems; nanoelectronics; nanoscale architecture; parametric analysis; parasitic modeling; parasitic simulation; placement optimization; post-placement optimization; power analysis; power grid analysis and design; real-time systems; reliability; signal integrity; statistical timing analysis; system level design; system level interconnection; systemC; technology driven layout; thermal analysis; variation modeling;
Conference_Titel :
Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
1-59593-389-1
DOI :
10.1109/ICCAD.2006.320109