DocumentCode
1648547
Title
Macro Testability; The Results of Production Device Applications
Author
Bouwman, Frank ; Oostdijk, Steven ; Stans, Rudi ; Bennetts, Ben ; Beenker, Frans
fYear
1992
Firstpage
232
Keywords
Application software; Assembly; Integrated circuit testing; Laboratories; Logic design; Logic devices; Production; Software testing; Software tools; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527824
Filename
527824
Link To Document