Title :
A new amplitude and phase compensation scheme under fast fading environment for OFDM packet transmission systems
Author :
Funada, Ryuhei ; Harada, Hiroshi ; Kamio, Yukiyoshi ; Shinoda, Shoji ; Fujise, Masayuki
Author_Institution :
Graduate Sch. of Sci. & Eng., Chuo Univ., Tokyo, Japan
fDate :
6/23/1905 12:00:00 AM
Abstract :
This paper proposes a new amplitude and phase compensation scheme for OFDM packet transmission systems in order to compensate severe and time-variant fluctuation of the received signal amplitude and phase under fast fading environment. The proposed scheme, in addition to the conventional scheme that averages and updates the estimated propagation characteristics on each subchannel, detects subchannels that are momentarily distorted by noise and inter-carrier-interference (ICI) over the fast frequency-selective channels, or by the sudden intercept owing to the shadowing effects. The information of the detected subchannel is used to improve accuracy of the compensation when update the estimated propagation characteristics. The performance of the proposed OFDM packet transmission system was evaluated from several aspects by computer simulation. As a result, by using the proposed scheme, packet error rate (PER) is improved under a high-mobility environment in comparison with the conventional scheme
Keywords :
OFDM modulation; land mobile radio; packet radio networks; radiofrequency interference; radiowave propagation; OFDM packet transmission systems; amplitude compensation; computer simulation; estimated propagation characteristics; fast fading environment; fast frequency-selective channels; intercarrier-interference; noise; packet error rate; phase compensation; received signal amplitude; received signal phase; shadowing effects; subchannel; time-variant fluctuation; Fading; Fluctuations; Frequency estimation; Interference; OFDM; Paper technology; Physical layer; Shadow mapping; System performance; Working environment noise;
Conference_Titel :
Vehicular Technology Conference, 2001. VTC 2001 Fall. IEEE VTS 54th
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-7005-8
DOI :
10.1109/VTC.2001.957113