Title :
Enabling Variability Aware Analysis
Abstract :
Summary form only for tutorial.
Keywords :
Costs; Design automation; Design for manufacture; Electronic design automation and methodology; Foundries; Image resolution; Lithography; Manufacturing; Statistical analysis; Timing;
Conference_Titel :
Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
1-59593-389-1
DOI :
10.1109/ICCAD.2006.320041
