Title :
Power and Thermal Challenges for 65 nm and Below
Abstract :
Summary form only for tutorial.
Keywords :
CMOS technology; Circuits and systems; Electrothermal effects; Energy management; Power dissipation; Power system management; Power system modeling; Power system reliability; Thermal factors; Thermal management;
Conference_Titel :
Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
1-59593-389-1
DOI :
10.1109/ICCAD.2006.320043
