Title :
CMRF special session: Compact models for RF-microwave applications
Author :
Van der Toorn, Ramses
Author_Institution :
TU Delft, The Netherlands
Abstract :
The CMRF 2010 will explore the theme “TCAD Meets Compact Modeling”. Device simulations (TCAD) and Compact Modeling (CM) are complementary. Both serve device characterization. TCAD-based physical insight may provide a basis for physics-based compact model development. TCAD and CM can be combined to predict device and even circuit performance in future technologies. Compact model parameter extraction can be supported from TCAD.
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2010 IEEE
Conference_Location :
Austin, TX, USA
Print_ISBN :
978-1-4244-8578-9
DOI :
10.1109/BIPOL.2010.5668093
