Abstract :
The following topics are dealt with: modern microprocessors; memory system optimization; automotive and energy-management systems; low-power design; EDA solutions; next generation computing; thermal management; embedded systems; routing solutions for upcoming NoC challenges; system-level power and reliability estimation; medical and healthcare applications; testing of nonvolatile memories; memristor technology; formal verification flow; system-on-chip composition; timing analysis; ultimate CMOS; nanoelectronic devices; RF and mixed-signal IC; digital communication systems; and logic synthesis.
Keywords :
automobiles; embedded systems; energy management systems; formal verification; health care; integrated circuit design; integrated circuit reliability; low-power electronics; memristors; microprocessor chips; mixed analogue-digital integrated circuits; nanoelectronics; network routing; network-on-chip; random-access storage; EDA solutions; NoC challenges; RFIC; SoC; automotive; digital communication systems; embedded systems; energy-management systems; formal verification flow; healthcare applications; logic synthesis; low-power design; medical applications; memory system optimization; memristor technology; mixed-signal IC; modern microprocessors; nanoelectronic devices; next generation computing; nonvolatile memories; reliability estimation; routing solutions; system-level power; system-on-chip composition; thermal management; timing analysis; ultimate CMOS;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-2145-8
DOI :
10.1109/DATE.2012.6176407
