DocumentCode :
1649180
Title :
Low-loss MEMS band-pass filters with improved out-of-band rejection by exploiting inductive parasitics
Author :
Shim, Yonghyun ; Tabrizian, Roozbeh ; Ayazi, Farrokh ; Rais-Zadeh, Mina
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2009
Firstpage :
1
Lastpage :
4
Abstract :
This paper reports on a new implementation of integrated lumped filters with improved out-of-band rejection and passband loss. Inductive parasitics are exploited to provide additional transmission zeros at the high frequency end, which can improve both the out-of-band rejection and roll-off. Thick silver is electroplated to reduce the insertion loss and achieve high quality factor. An insertion loss of better than 3 dB has been achieved for filters across 220 MHz to 640 MHz with unloaded Q as high as 50. The out-of-band rejection of filters is as high as 60 dB. These are believed to be the highest performing integrated filters in terms of out-of-band attenuation and spurious-free response implemented on silicon substrate.
Keywords :
band-pass filters; electroplated coatings; micromechanical devices; poles and zeros; MEMS band-pass filters; frequency 220 MHz to 640 MHz; inductive parasitics; integrated lumped filters; out-of-band rejection; passband loss; transmission zeros; Attenuation; Band pass filters; Filtering theory; Frequency; Insertion loss; Micromechanical devices; Passband; Q factor; Silicon; Silver;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2009 IEEE International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-5639-0
Electronic_ISBN :
978-1-4244-5640-6
Type :
conf
DOI :
10.1109/IEDM.2009.5424220
Filename :
5424220
Link To Document :
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