• DocumentCode
    1649180
  • Title

    Low-loss MEMS band-pass filters with improved out-of-band rejection by exploiting inductive parasitics

  • Author

    Shim, Yonghyun ; Tabrizian, Roozbeh ; Ayazi, Farrokh ; Rais-Zadeh, Mina

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper reports on a new implementation of integrated lumped filters with improved out-of-band rejection and passband loss. Inductive parasitics are exploited to provide additional transmission zeros at the high frequency end, which can improve both the out-of-band rejection and roll-off. Thick silver is electroplated to reduce the insertion loss and achieve high quality factor. An insertion loss of better than 3 dB has been achieved for filters across 220 MHz to 640 MHz with unloaded Q as high as 50. The out-of-band rejection of filters is as high as 60 dB. These are believed to be the highest performing integrated filters in terms of out-of-band attenuation and spurious-free response implemented on silicon substrate.
  • Keywords
    band-pass filters; electroplated coatings; micromechanical devices; poles and zeros; MEMS band-pass filters; frequency 220 MHz to 640 MHz; inductive parasitics; integrated lumped filters; out-of-band rejection; passband loss; transmission zeros; Attenuation; Band pass filters; Filtering theory; Frequency; Insertion loss; Micromechanical devices; Passband; Q factor; Silicon; Silver;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2009 IEEE International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-4244-5639-0
  • Electronic_ISBN
    978-1-4244-5640-6
  • Type

    conf

  • DOI
    10.1109/IEDM.2009.5424220
  • Filename
    5424220