Title :
CORRELATION OF CAPACITIVE LOAD DELAY
Author :
Edeleman, Ran ; Kreiser, Ishai
Keywords :
Capacitors; Data engineering; Delay; Electronic equipment testing; Fixtures; Oscilloscopes; Pins; Radio access networks; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527826
