Title :
The effect of N-doping of MQWS on the properties of deep ridge transistor lasers
Author :
Lijun Qiao ; Song Liang ; Liangshun Han ; Junjie Xu ; Hongliang Zhu
Author_Institution :
Key Lab. of Semicond. Mater. Sci., Inst. of Semicond., Beijing, China
Abstract :
Transistor lasers (TLs) with n-doped quantum wells (QWs), which own low threshold current, are reported in this paper. The exposed side walls of QWs introduce amounts of recombination centers, which damages the properties of deep ridge TLs greatly. It is found that the heavily doping in quantum wells can effectively alleviate this effect. Assuming that the surface recombination is 106 cm/s, the light output power and current gain of common emitter configurations as functions of varying doping concentration and ridge width are studied. With doping concentration of 1018 cm-3 and ridge width of 2μm, the threshold current of TLs can be reduced from more than 100 mA to 31 mA and current gain can be increased from 0.1 to 2.4.
Keywords :
quantum well lasers; semiconductor doping; surface recombination; transistors; MQWS; N-doping effect; common emitter configurations; current gain; deep ridge TL; deep ridge transistor lasers; light output power; low threshold current; n-doped quantum wells; ridge width; surface recombination; varying doping concentration; Doping; Modulation; Power generation; Quantum well devices; Radiative recombination; Threshold current; Transistors; doping concentration; n-doped MQWs; ridge width; surface recombination; transistor lasers;
Conference_Titel :
Optical Communications and Networks (ICOCN), 2015 14th International Conference on
Conference_Location :
Nanjing
DOI :
10.1109/ICOCN.2015.7203754