Title :
Combined analysis of systematic and random uncertainties for different noise-figure characterization methodologies
Author :
Collado, A. ; Collantes, J.M. ; de la Fuente, L. ; Otegi, N. ; Perea, L. ; Sayed, M.
Author_Institution :
Electricity & Electron. Dept., Univ. of the Basque Country, Bilbao, Spain
Abstract :
This paper presents a simulation tool for the rigorous analysis of the final uncertainty associated to different methodologies for noise figure characterization. The simulation tool permits the analysis of the combined effect of systematic errors and underlying uncertainties versus any significant characteristic of the DUT or measurement setup. Some application examples are presented showing the suitability of the proposed approach to determine the most efficient characterization methodology for a given DUT and measurement setup.
Keywords :
electric noise measurement; measurement errors; measurement uncertainty; device under test; measurement error; noise figure; random uncertainty; simulation tool; systematic uncertainty; Acoustic reflection; Analytical models; Circuits; Error correction; Noise figure; Noise measurement; Scattering parameters; Temperature; Time measurement; Uncertainty;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1212638
