DocumentCode
1650045
Title
Notice of Retraction
The influence of technological attributes on technology valuation in Korea
Author
Hyun-Woo Park ; Do-Baek Nah ; Sun-Hi Yoo
Author_Institution
Inf. Anal. Center, Korea Inst. of Sci. & Technol. Inf., Seoul, South Korea
Volume
2
fYear
2010
Firstpage
413
Lastpage
417
Abstract
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
This study empirically analyzes the characteristics of the various attributes of technology that influence the economic values of technologies, based on the cases of technology valuation carried out in Korea.
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
This study empirically analyzes the characteristics of the various attributes of technology that influence the economic values of technologies, based on the cases of technology valuation carried out in Korea.
Keywords
financial management; macroeconomics; technology management; Korea; discounted cash flow; economic values; technology attributes; technology valuation; Commercialization; Construction industry; Cost accounting; Machinery; Materials; Patents; Transportation; application attributes; determinants of technology value; discounted cash flow; intrinsic attributes; technology valuation;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Management Science (ICAMS), 2010 IEEE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-6931-4
Type
conf
DOI
10.1109/ICAMS.2010.5552952
Filename
5552952
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