Title :
Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem
Author :
Ibrahim, Walid ; El-Chouemi, Amr ; El-Sayed, Hesham
fDate :
3/8/2006 12:00:00 AM
Keywords :
Algorithm design and analysis; Controllability; Costs; Educational institutions; Genetic algorithms; Information technology; Microprocessors; System testing; System-on-a-chip; Very large scale integration;
Conference_Titel :
Computer Systems and Applications, 2006. IEEE International Conference on.
Print_ISBN :
1-4244-0211-5
DOI :
10.1109/AICCSA.2006.205122
