Title :
Multiplexing Schemes in Single-Electron Technology
Author :
Sulieman, Mawahib H. ; Beiu, Valeriu
fDate :
3/8/2006 12:00:00 AM
Keywords :
CMOS logic circuits; CMOS technology; Capacitors; Educational institutions; Fault tolerance; Information technology; Nanoscale devices; Power dissipation; Redundancy; Uncertainty;
Conference_Titel :
Computer Systems and Applications, 2006. IEEE International Conference on.
Print_ISBN :
1-4244-0211-5
DOI :
10.1109/AICCSA.2006.205125
