DocumentCode
1650249
Title
Handling Inductance in Early Power Grid Verification
Author
Ghani, Nahi H Abdul ; Najm, Farid N.
Author_Institution
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont.
fYear
2006
Firstpage
127
Lastpage
134
Abstract
As part of integrated circuit design verification, one should check if the voltage drop on the power grid exceeds some critical threshold. One way to do this is by simulation, but that is computationally expensive and gets prohibitive for large circuits with a large variety of possible operational modes. Another limitation of a simulation-based approach is that it requires complete knowledge of the logic circuitry drawing current from the grid, thus precluding grid verification early in the design process. In this paper, we model the grid as an RLC circuit and we propose three verification techniques that can be applied in the early stages of the design process. These techniques do not require exact knowledge of the circuit currents. Instead, the currents drawn by the logic beneath the power grid are described by means of current constraints that capture the uncertainty about circuit details and activity. The first verification approach gives the exact worst-case voltage drop at every node of the grid, but it is slow. A second faster approach gives conservative bounds on the worst-case voltage drop at every node of the grid. The third approach is much faster; it is a conservative approach which simply checks if the grid voltage drop exceeds some pre-defined thresholds, without actually computing the worst-case voltage drop at every node
Keywords
RLC circuits; electric potential; inductance; integrated circuit design; low-power electronics; RLC circuit; inductance; integrated circuit design verification; power grid verification; voltage drop; Circuit simulation; Computational modeling; Inductance; Integrated circuit synthesis; Logic circuits; Logic design; Power grids; Process design; RLC circuits; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
1-59593-389-1
Electronic_ISBN
1092-3152
Type
conf
DOI
10.1109/ICCAD.2006.320076
Filename
4110164
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