Title :
Semi-Algorithmic Test Pattern Generation
Author :
Shahhoseini, Hadi Shahriar ; Kazerouni, Babak Hosseini
fDate :
3/8/2006 12:00:00 AM
Keywords :
Algorithm design and analysis; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Flow graphs; Logic testing; Reliability engineering; Software testing; Test pattern generators;
Conference_Titel :
Computer Systems and Applications, 2006. IEEE International Conference on.
Print_ISBN :
1-4244-0211-5
DOI :
10.1109/AICCSA.2006.205126
