• DocumentCode
    1650424
  • Title

    Quantifying the impact of frequency scaling on the energy efficiency of the single-chip cloud computer

  • Author

    Bartolini, Andrea ; Sadri, MohammadSadegh ; Furst, John-Nicholas ; Coskun, Ayse Kivilcim ; Benini, Luca

  • Author_Institution
    DEIS, Univ. of Bologna, Bologna, Italy
  • fYear
    2012
  • Firstpage
    181
  • Lastpage
    186
  • Abstract
    Dynamic frequency and voltage scaling (DVFS) techniques have been widely used for meeting energy constraints. Single-chip many-core systems bring new challenges owing to the large number of operating points and the shift to message passing interface (MPI) from shared memory communication. DVFS, however, has been mostly studied on single-chip systems with one or few cores, without considering the impact of the communication among cores. This paper evaluates the impact of frequency scaling on the performance and power of many-core systems with MPI. We conduct experiments on the Single-Chip Cloud Computer (SCC), an experimental many-core processor developed by Intel. The paper first introduces the run-time monitoring infrastructure and the application suite we have designed for an in-depth evaluation of the SCC. We provide an extensive analysis quantifying the effects of frequency perturbations on performance and energy efficiency. Experimental results show that run-time communication patterns lead to significant differences in power/performance tradeoffs in many-core systems with MPI.
  • Keywords
    application program interfaces; cloud computing; message passing; microprocessor chips; multiprocessing systems; performance evaluation; power aware computing; shared memory systems; DVFS; MPI; dynamic frequency and voltage scaling; energy constraints; energy efficiency; frequency perturbation; frequency scaling; many-core processor; message passing interface; performance efficiency; run time communication pattern; run-time monitoring infrastructure; shared memory communication; single-chip cloud computer; single-chip many-core system; Artificial neural networks; Benchmark testing; Radiation detectors; Temperature measurement; Tiles; Time frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176459
  • Filename
    6176459