Title :
Failure modeling for the ATM switching system under the development phase using Weibull distribution
Author_Institution :
Quality Assurance Team, ETRI, Taejon, South Korea
Abstract :
This modeling analyzes the fluctuations for the whole failure data of past, present, and future ATM switching systems under the development phase, which is a core node in building the B-ISDN.
Keywords :
Weibull distribution; asynchronous transfer mode; telecommunication network reliability; ATM switching system; Weibull distribution; development phase; failure modeling; Asynchronous transfer mode; Debugging; Equations; Failure analysis; Fluctuations; Quality assurance; Shape; Switching systems; System testing; Weibull distribution;
Conference_Titel :
Communications, 1999. APCC/OECC '99. Fifth Asia-Pacific Conference on ... and Fourth Optoelectronics and Communications Conference
Conference_Location :
Beijing, China
Print_ISBN :
7-5635-0402-8
DOI :
10.1109/APCC.1999.824521
