• DocumentCode
    1650583
  • Title

    COM(Cost Oriented Memory) Testing

  • Author

    Yamada, T. ; Fujiwara, A. ; Inoue, M.

  • fYear
    1992
  • Firstpage
    259
  • Keywords
    Automatic testing; Built-in self-test; Circuit testing; Costs; Integrated circuit testing; Life estimation; Maintenance; Random access memory; Temperature; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527831
  • Filename
    527831
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1650583