Title :
COM(Cost Oriented Memory) Testing
Author :
Yamada, T. ; Fujiwara, A. ; Inoue, M.
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Costs; Integrated circuit testing; Life estimation; Maintenance; Random access memory; Temperature; Timing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527831
