• DocumentCode
    1650705
  • Title

    Batch sizing with random yield and imperfect inspection and process compressibility

  • Author

    Aryanezhad, M.B. ; Karimi-Nasab, M. ; Noorollahi, E. ; Ghoreyshi, S.M.

  • Author_Institution
    Dept. of Ind. Eng., Iran Univ. of Sci. & Technol., Tehran, Iran
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a new model for batch sizing in an imperfect production system that utilizes from an inspection subsystem for screening defective items from non-defectives. The needed setup time for starting the rework process is considered as a stochastic parameter. Regular production process and rework process could be done with different production rate and different stochastic percent of defectives. In this way, batch sizing is accompanied with random yield. Also production and / or rework processes could be performed in a time interval for each item by paying its corresponding cost. On the other hand, inspection is involved with some errors that result in returned items from the customers back to the producer. The proposed model considers many realistic conditions to obtain an optimal production plan of some decision variables like batch size, backlog, regular production rate, and rework rate simultaneously. Finally the proposed model is solved by the PSO algorithm and computational experiences are reported.
  • Keywords
    batch processing (industrial); inspection; particle swarm optimisation; production planning; stochastic processes; PSO algorithm; batch sizing; defective items; imperfect inspection; imperfect production system; process compressibility; production rate; random yield; regular production process; rework process; screening; stochastic parameter; Computational modeling; Equations; Industrial engineering; Inspection; Mathematical model; Production; Random variables; Imperfect Production; Inspection; Process Compressibility; Random Yield; Rework; Scrap;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Industrial Engineering (CIE), 2010 40th International Conference on
  • Conference_Location
    Awaji
  • Print_ISBN
    978-1-4244-7295-6
  • Type

    conf

  • DOI
    10.1109/ICCIE.2010.5668221
  • Filename
    5668221