Title :
Reconstruction of tightly focused beams using Mie-scattering
Author :
Bauer, Thomas ; Orlov, Sergej ; Peschel, Ulf ; Banzer, Peter ; Leuchs, Gerd
Author_Institution :
Max Planck Inst. for the Sci. of Light, Erlangen, Germany
Abstract :
By using a sub-wavelength nano-particle as a field probe and a tailored detection scheme we are able to reconstruct the electric energy density in the focal plane of a high numerical aperture focusing system.
Keywords :
Mie scattering; focal planes; image reconstruction; nanoparticles; nanophotonics; optical focusing; Mie-scattering; electric energy density; field probe; focal plane; high numerical aperture focusing; image reconstruction; subwavelength nanoparticle; tailored detection; tightly focused beams; Apertures; Glass; Image reconstruction; Microscopy; Optimized production technology; Probes; Scattering;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
