1651130

Radiation-induced clock jitter and race

Seifert, Norbert ; Shipley, Paul ; Pant, M.D. ; Ambrose, Vinod ; Gill, Balkaran

Logic Technol. Dev. Q&R, Intel Corp., Hillsboro, OR, USA

2005

215

222

error statistics; flip-flops; hazards and race conditions; integrated circuit reliability; jitter; pulse generators; radiation effects; radiation hardening (electronics); semiconductor device reliability; clock generator; clock nodes; flip flop; hardened pulse generator; hardened pulse latch; pulse latch; radiation-induced clock jitter; radiation-induced race; radiation-induced single event upsets; reliability risk; soft error rate; Clocks; Error analysis; Jitter; Microprocessors; Modems; Neutrons; Pulse generation; Radiation hardening; SPICE; Single event upset;

English

ieee

Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International

0-7803-8803-8

conf

10.1109/RELPHY.2005.1493087

1493087