Title :
A voltage scaling model for performance evaluation in digital CMOS circuits
Author :
Von Arnim, Klaus ; Schruefer, Klaus ; Baumann, Thomas ; Hofmann, Karl ; Schulz, Thomas ; Pacha, Christian ; Berthold, Joerg
Author_Institution :
Infineon Technol., Munich, Germany
Abstract :
We present an easy to use method to extrapolate digital circuit performance and power from nominal to worst-case operating conditions. It allows the circuit designer to explore the design space over a continuous rage of voltages and temperatures and for different process conditions. Voltage scaling is identified as a key challenge for the 22 nm technology node.
Keywords :
CMOS digital integrated circuits; integrated circuit modelling; circuit designer; digital CMOS circuits; digital circuit performance evaluation; size 22 nm; voltage scaling model; CMOS digital integrated circuits; CMOS technology; Delay; Digital circuits; Dynamic voltage scaling; Semiconductor device modeling; Software libraries; Temperature distribution; Temperature sensors; Threshold voltage;
Conference_Titel :
Electron Devices Meeting (IEDM), 2009 IEEE International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-5639-0
Electronic_ISBN :
978-1-4244-5640-6
DOI :
10.1109/IEDM.2009.5424310
