DocumentCode :
1651749
Title :
Implementing automated equipment performance control in the manufacturing work cell
Author :
Pomorski, Tom
Author_Institution :
Data Manage. Div., Nat. Semicond. Corp., South Portland, ME, USA
fYear :
1994
Firstpage :
161
Lastpage :
168
Abstract :
This paper describes a design and implementation roadmap utilized to establish automated manufacturing equipment controls within the class 100 wafer fabrication area of the National Semiconductor, Data Management Division, South Portland, Maine, facility. The integration of automated equipment controls, including recipe downloads, process parameter verification, and real-time performance monitoring is a key element in the creation of a High Performance Manufacturing Work Cell. The design and implementation of equipment control follows a structured process which ensures alignment with the organization´s mission, goals, and core values. The process roadmap begins with the work cell vision and continues through sequential development to a fully functional equipment control implementation. The roadmap also suggests tools and documentation to support the development process. As an integral component in the work cell design, automated equipment performance control offers potential benefits in work cell productivity, product yields, cycle time, and resource utilization. Specific examples of successful equipment control, including interface options for non-SECS compatible equipment, are discussed
Keywords :
integrated circuit manufacture; National Semiconductor; automated equipment performance control; class 100 wafer fabrication area; cycle time; documentation; manufacturing equipment control; manufacturing work cell; process parameter verification; product yields; productivity; real-time performance monitoring; recipe downloads; resource utilization; support tools; work cell vision; Automatic control; Computerized monitoring; Condition monitoring; Documentation; Fabrication; Manufacturing automation; Manufacturing processes; Productivity; Pulp manufacturing; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop. 1994 IEEE/SEMI
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-2053-0
Type :
conf
DOI :
10.1109/ASMC.1994.588233
Filename :
588233
Link To Document :
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