Title :
Optimal Seguencing of Scan Registers
Author :
Narayanan, Sridhar ; Njinda, Charles ; Breuer, Melvin
Keywords :
Circuit testing; Costs; Degradation; Design for testability; Flip-flops; Hardware; Multiplexing; Pins; Registers; Test equipment;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527836
