DocumentCode :
1652023
Title :
Applying asymmetric-stratified data envelopment analysis model for bankruptcy prediction
Author :
Kuo, Yi-Chun
Author_Institution :
Dept. of Int. Trade, Chung Yuan Christian Univ., Chungli, Taiwan
fYear :
2010
Firstpage :
1
Lastpage :
6
Abstract :
The high social costs associated with bankruptcy have spurred searches for better prediction capability. We propose a nonparametric approach for bankruptcy prediction, using data envelopment analysis (DEA) model to identify the boundaries of bankruptcy and non-bankruptcy. The benchmarks of non-bankruptcy and bankruptcy can construct two piecewise frontiers to dominate two convexity classes. Overlap might appear if companies dominated by both frontiers simultaneously, which results in the Type I and Type II errors. The proposed asymmetric-stratified DEA model was applied to find the sequential layers of frontiers. By minimizing the misclassification cost in accordance with different risks and costs of Type I and Type II errors, we identified the optimal layers of frontier to be as separating hyperplane. Based on a sample with equivalent costs of Type I and Type II errors, our approach perform high prediction accuracy with the hit-ratios 94.44% on training and 91.67% on hold-out samples. Iif the proportion of Type II to Type I cost is greater than 10, the results indicate hit-ratio and misclassification cost trade-off to each other. Not alike traditional cut-off value approach used in discriminant analysis, this asymmetric-layering approach can provide more than one alternatives of discriminant hyperplane for bankruptcy prediction in accordance with the institutions´ risk attitude.
Keywords :
costing; data envelopment analysis; decision making; statistical analysis; Type I-Type II errors; asymmetric-stratified data envelopment analysis; bankruptcy prediction; discriminant analysis; hyperplane; misclassification cost; social costs; Accuracy; Benchmark testing; Companies; Data envelopment analysis; Data models; Predictive models; Training; bankruptcy prediction; data envelopment analysis (DEA); discriminant; misclassification cost; overlap;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computers and Industrial Engineering (CIE), 2010 40th International Conference on
Conference_Location :
Awaji
Print_ISBN :
978-1-4244-7295-6
Type :
conf
DOI :
10.1109/ICCIE.2010.5668271
Filename :
5668271
Link To Document :
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