DocumentCode
1652065
Title
Beyond innovation: Dealing with the risks and complexity of processor design in 22nm
Author
Anderson, Carl John
Author_Institution
IBM, Austin, TX, USA
fYear
2009
Firstpage
1
Lastpage
1
Abstract
This paper discusses the importance of discipline and risk management in the design of new high performance microprocessors in advanced technologies. Innovation is very important in these designs but the design costs have to be assessed and the risks managed.
Keywords
CMOS integrated circuits; circuit complexity; integrated circuit design; microprocessor chips; risk management; complexity; discipline management; microprocessors; processor design; risk management; size 22 nm; Bipolar transistor circuits; CMOS logic circuits; Circuit synthesis; Costs; Logic circuits; Microprocessors; Process design; Productivity; Risk management; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2009 IEEE International
Conference_Location
Baltimore, MD
Print_ISBN
978-1-4244-5639-0
Electronic_ISBN
978-1-4244-5640-6
Type
conf
DOI
10.1109/IEDM.2009.5424328
Filename
5424328
Link To Document