• DocumentCode
    1652065
  • Title

    Beyond innovation: Dealing with the risks and complexity of processor design in 22nm

  • Author

    Anderson, Carl John

  • Author_Institution
    IBM, Austin, TX, USA
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This paper discusses the importance of discipline and risk management in the design of new high performance microprocessors in advanced technologies. Innovation is very important in these designs but the design costs have to be assessed and the risks managed.
  • Keywords
    CMOS integrated circuits; circuit complexity; integrated circuit design; microprocessor chips; risk management; complexity; discipline management; microprocessors; processor design; risk management; size 22 nm; Bipolar transistor circuits; CMOS logic circuits; Circuit synthesis; Costs; Logic circuits; Microprocessors; Process design; Productivity; Risk management; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2009 IEEE International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-4244-5639-0
  • Electronic_ISBN
    978-1-4244-5640-6
  • Type

    conf

  • DOI
    10.1109/IEDM.2009.5424328
  • Filename
    5424328