DocumentCode
1652425
Title
TEST GENERATION AND CONCURIPENT ERROR DETECTION IN CURRENT-MODE A/D CONVERTERS
Author
Krishnan, Shoba ; Sahli, Sondes ; Wey, Chin-Long
fYear
1992
Firstpage
312
Keywords
Analog circuits; Analog-digital conversion; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Low-frequency noise; Signal processing algorithms; Switching converters; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527838
Filename
527838
Link To Document