Title :
TEST GENERATION AND CONCURIPENT ERROR DETECTION IN CURRENT-MODE A/D CONVERTERS
Author :
Krishnan, Shoba ; Sahli, Sondes ; Wey, Chin-Long
Keywords :
Analog circuits; Analog-digital conversion; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Low-frequency noise; Signal processing algorithms; Switching converters; Voltage;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527838
