DocumentCode :
1652525
Title :
Post-Routing Redundant Via Insertion and Line End Extension with Via Density Consideration
Author :
Lee, Kuang-Yao ; Wang, Ting-Chi ; Chao, Kai-Yuan
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu
fYear :
2006
Firstpage :
633
Lastpage :
640
Abstract :
Redundant via insertion and line end extension employed in the post-routing stage are two well known and highly recommended techniques to reduce yield loss due to via failure. However, if the amount of inserted redundant vias is not well controlled, it could violate via density rules and adversely worsen the yield and reliability of the design. In this paper, we first study the problem of redundant via insertion, and present two methods to accelerate a state-of-the-art approach (which is based on a maximum independent set (MIS) formulation) to solve it. We then consider the problem of simultaneous redundant via insertion and line end extension. We formulate the problem as a maximum weighted independent set (MWIS) problem and modify the accelerated MIS-based approach to solve it. Lastly, we investigate the problem of simultaneous redundant via insertion and line end extension subject to the maximum via density rule, and present a two-stage approach for it. In the first stage, we ignore the maximum via density rule, and enhance the MWIS-based approach to find the set of regions which violate the maximum via density rule after performing simultaneous redundant via insertion and line end extension. In the second stage, excess redundant vias are removed from those violating regions such that after the removal, the maximum via density rule is met while the total amount of redundant vias removed is minimized. This density-aware redundant via removal problem is formulated as a set of zero-one integer linear programming (0-1 ILP) problems each of which can be solved independently without sacrificing the optimality. The superiorities of our approaches are all demonstrated through promising experimental results
Keywords :
linear programming; manufacturing processes; density consideration; line end extension; maximum independent set formulation; maximum via density rule; maximum weighted independent set problem; post-routing redundant via insertion; via failure; yield loss reduction; zero-one integer linear programming; Acceleration; Chaos; Computer science; Contact resistance; Design for manufacture; Integrated circuit layout; Manufacturing processes; Permission; Routing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
1-59593-389-1
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2006.320027
Filename :
4110243
Link To Document :
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