DocumentCode
1652537
Title
Exploiting binary translation for fast ASIP design space exploration on FPGAs
Author
Pomata, Sebastiano ; Meloni, Paolo ; Tuveri, Giuseppe ; Raffo, Luigi ; Lindwer, Menno
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Cagliari, Cagliari, Italy
fYear
2012
Firstpage
566
Lastpage
569
Abstract
Complex Application Specific Instruction-set Processors (ASIPs) expose to the designer a large number of degrees of freedom, posing the need for highly accurate and rapid simulation environments. FPGA-based emulators represent an alternative to software cycle-accurate simulators, preserving maximum accuracy and reasonable simulation times. The work presented in this paper aims at exploiting FPGA emulation within technology aware design space exploration of ASIPs. The potential speedup provided by reconfigurable logic is reduced by the overhead of RTL synthesis/implementation. This overhead can be mitigated by reducing the number of FPGA implementation processes, through the adoption of binary-level translation. Hereby we present a prototyping method that, given a set of candidate ASIP configurations, defines an overdimensioned ASIP architecture, capable of emulating all the design space points under evaluation. This approach is then evaluated with a design space exploration case study. Along with execution time, by coupling FPGA emulation with activity-based physical modeling, we can extract area/power/energy figures.
Keywords
field programmable gate arrays; instruction sets; logic design; logic simulation; reconfigurable architectures; FPGA-based emulators; RTL synthesis; activity-based physical modeling; application specific instruction set processors; binary-level translation; design space points; fast ASIP design space exploration; overdimensioned ASIP architecture; overhead mitigation; prototyping method; rapid simulation environments; reconflgurable logic; technology aware design space exploration; Computer architecture; Emulation; Field programmable gate arrays; Program processors; Registers; Space exploration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4577-2145-8
Type
conf
DOI
10.1109/DATE.2012.6176533
Filename
6176533
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