1653121

Interconnect and delay testing with a 4800-pin board tester

Kameyama, Shuichi ; Ohara, Hideyuki ; Endo, Chihiro ; Takayama, Naoki

1995

338

Circuit testing; Clocks; Costs; Delay; Integrated circuit interconnections; Large-scale systems; Packaging; Probes; System testing; Very large scale integration;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527841

527841