Title :
Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress
Author :
Sowariraj, M.S.B. ; De Jong, Peter C. ; Cora, S.M. ; Smedes, Theo ; Mouthaan, A. J Ton ; Kuper, Fred G.
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
Keywords :
capacitance; capacitors; electric current; electrostatic discharge; semiconductor device models; substrates; CDM stress; ESD; IC circuit design; discharge current path; full chip circuit model; package capacitors; static charge sources; substrate capacitance; Capacitance; Capacitors; Circuit synthesis; Circuit testing; Fault location; Integrated circuit modeling; Integrated circuit packaging; Protection; Stress; Voltage;
Conference_Titel :
Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
Print_ISBN :
0-7803-8803-8
DOI :
10.1109/RELPHY.2005.1493166
