• DocumentCode
    1653197
  • Title

    Testing Errors: Data and Calculations in an IC Manufacturing Process

  • Author

    Williams, Richard H. ; Wagner, R. Glenn ; Hawkins, Charles F.

  • fYear
    1995
  • Firstpage
    352
  • Keywords
    Circuit testing; Computer errors; Costs; Failure analysis; Frequency estimation; Integrated circuit testing; MOS integrated circuits; Manufacturing processes; Production; Reliability engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527843
  • Filename
    527843
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1653197