Title :
Failure analysis of pixel shorting problems in polymer light emitting diode (PLED) displays
Author :
Wu, L. ; Johnson, A. ; Kolosov, D. ; Parker, I. ; Trujillo, J.
Author_Institution :
DuPont Displays Inc, Santa Barbara, CA, USA
Keywords :
LED displays; failure analysis; organic light emitting diodes; reliability; FIB; SEM; display uniformity; driver problems; electrical characterization; excess current; failure analysis; failure mechanisms; optical microscopy; organic light emitting diode displays; pixel shorting problems; pixel shorts; polymer LED displays; polymer light emitting diode displays; reliability problem; Failure analysis; Flat panel displays; Indium tin oxide; Light emitting diodes; Optical buffering; Optical microscopy; Optical polymers; Organic light emitting diodes; Scanning electron microscopy; Stimulated emission;
Conference_Titel :
Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
Print_ISBN :
0-7803-8803-8
DOI :
10.1109/RELPHY.2005.1493171
