1653603

An ATPG driver selection algorithm for interconnect test with boundary scan

Her, Wei-Cheng ; Jin, Lin-Ming ; El-Ziq, Yacoub

1995

382

Automatic test pattern generation; Bridges; Driver circuits; Electronic equipment testing; Fault detection; Integrated circuit testing; Logic; Pins; Registers; Test pattern generators;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527847

527847