DocumentCode :
1653758
Title :
Temperature derivatives of the dynamic permittivity and permeability of the simple thickness modes of quartz plates
Author :
Kosinski, J. ; Ballato, A. ; Lukaszek, T. ; Mizan, M. ; McGowan, R. ; Klohn, K.
Author_Institution :
US Army Electron. Technol. & Devices Lab., Ft. Monmouth, NJ, USA
fYear :
1988
Firstpage :
53
Lastpage :
64
Abstract :
The quartz material properties are obtained from measurements of the mass-loaded resonance frequencies of various harmonics of a set of carefully fabricated thickness-mode resonators. The measurement system is based on IEC-444 and its performance has been extensively verified. To date, one set of resonators using thickness excitation of the thickness modes has been measured using this system. The data thus obtained have been reduced using a one-dimensional analysis incorporating the effects of mass loading and the full effects of piezoelectricity, yielding preliminary information on the temperature coefficients of certain elastic constants and on the temperature coefficients of piezoelectric coupling for the rotated Y-cuts. The temperature coefficients of the dynamic permittivity and dynamic permeability of the simple thickness modes of quartz plates are developed from the data as a sample application of the measurements
Keywords :
crystal resonators; harmonics; magnetic permeability; permittivity; quartz; IEC-444; SiO2 resonators; application; dynamic permeability; dynamic permittivity; effects of mass loading; effects of piezoelectricity; elastic constants; harmonics; mass-loaded resonance frequencies; measurement system; one-dimensional analysis; piezoelectric coupling; quartz material properties; quartz plates; rotated Y-cuts; temperature coefficients; thickness excitation; thickness modes; thickness-mode resonators; Frequency measurement; Information analysis; Material properties; Permeability; Permittivity measurement; Piezoelectricity; Resonance; Resonant frequency; Temperature; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location :
Baltimore, MD
Type :
conf
DOI :
10.1109/FREQ.1988.27580
Filename :
27580
Link To Document :
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